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arXiv · 1405.7281

Neutral particle Mass Spectrometry with Nanomechanical Systems

Eric Sage·Ariel Brenac·Thomas Alava·Robert Morel·Cécilia Dupré·Mehmet Selim Hanay·Michael L. Roukes·Laurent Duraffourg·Christophe Masselon·Sébastien Hentz
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Abstract

Current approaches to Mass Spectrometry (MS) require ionization of the analytes of interest. For high-mass species, the resulting charge state distribution can be complex and difficult to interpret correctly. In this article, using a setup comprising both conventional time-of-flight MS (TOF-MS) and Nano-Electro-Mechanical-Systems-based MS (NEMS-MS) in situ, we show directly that NEMS-MS analysis is insensitive to charge state: the spectrum consists of a single peak whatever the species charge state, making it significantly clearer than existing MS analysis. In subsequent tests, all charged particles are electrostatically removed from the beam, and unlike TOF-MS, NEMS-MS can still measure masses. This demonstrates the possibility to measure mass spectra for neutral particles. Thus, it is possible to envisage MS-based studies of analytes that are incompatible with current ionization techniques and the way is now open for the development of cutting edge system architectures with unique analytical capability.

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Eric Sage, Ariel Brenac, Thomas Alava, Robert Morel, Cécilia Dupré, Mehmet Selim Hanay, Michael L. Roukes, Laurent Duraffourg, Christophe Masselon, Sébastien Hentz. 2014-05-28. Neutral particle Mass Spectrometry with Nanomechanical Systems. https://doi.org/10.1038/ncomms7482

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