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arXiv · 1304.1777

High-resolution x-ray analysis with multilayer gratings

Philippe Jonnard·Karine Le Guen·Jean-Michel André
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Abstract

Periodic multilayers are nowadays widely used to perform x-ray analysis in the soft x-ray range (photon energy lower than 1 keV). However, they do not permit to obtain high-resolution spectra like natural or synthetic crystals. Thus, multilayers cannot resolve interferences between close x-ray lines. It has been shown and demonstrated experimentally that patterning a grating profile within a multilayer structure leads to a diffractive optics with improved resolving power. We illustrate the use of a Mo/B4C multilayer grating in the Fe L and C K spectral ranges, around 700 eV and 280 eV respectively. First, in the Fe L range, the improved spectral resolution enables us to distinguish the Fe Lαand Lβemissions (separated by 13 eV). In addition, using a sample made of a mix of LiF and an iron ore, we show that it is possible to easily resolve the F K and Fe L emissions. These examples demonstrate that an improved x-ray analysis can be obtained with multilayer gratings when there is the need to study samples having elements giving rise to close emission lines. Second, in the C K range, by comparing C Kαspectra from B4C and cellulose, we show that the shape of the emission band is sensitive to the chemical state of the carbon atom.

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Philippe Jonnard, Karine Le Guen, Jean-Michel André. 2013-04-05. High-resolution x-ray analysis with multilayer gratings. https://doi.org/10.1002/xrs.1128

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