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arXiv · 1302.4578

Finite element analysis of surface-stress effects in the Si lattice-parameter measurement

Carlo Sasso·Danilo Quagliotti·Enrico Massa·Giovanni Mana·Ulrich Kuetgens
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Abstract

A stress exists in solids surfaces, similarly to liquids, also if the underlying bulk material is stress-free. This paper investigates the surface stress effect on the measured value of the Si lattice parameter used to determine the Avogadro constant by counting Si atoms. An elastic-film model has been used to provide a surface load in a finite element analysis of the lattice strain of the x-ray interferometer crystal used to measure the lattice parameter. Eventually, an experiment is proposed to work a lattice parameter measurement out so that there is a visible effect of the surface stress.

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Carlo Sasso, Danilo Quagliotti, Enrico Massa, Giovanni Mana, Ulrich Kuetgens. 2013-02-19. Finite element analysis of surface-stress effects in the Si lattice-parameter measurement. https://arxiv.org/abs/1302.4578

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