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arXiv · 1209.5298

High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity

Marco Bazzan·Cinzia Sada·Nicola Argiolas·Alessandro C. Busacca·Roberto L. Oliveri·Salvatore Stivala·Luciano Curcio·Stefano Riva Sanseverino
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Abstract

Domain engineering technology in lithium tantalate is a well studied approach for nonlinear optical applications. However, for several cases of interest, the realization of short period structures (< 2 μm) is required, which make their characterization difficult with standard techniques. In this work, we show that high resolution x-ray diffraction is a convenient approach for the characterization of such structures, allowing us to obtain in a nondestructive fashion information such as the average domain period, the domain wall inclination, and the overall structure quality.

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Marco Bazzan, Cinzia Sada, Nicola Argiolas, Alessandro C. Busacca, Roberto L. Oliveri, Salvatore Stivala, Luciano Curcio, Stefano Riva Sanseverino. 2012-09-24. High resolution x-ray investigation of periodically poled lithium tantalate crystals with short periodicity. https://doi.org/10.1063/1.3264620

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