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arXiv · 1209.0111

Complex Permittivity Measurements at Variable Temperatures of Low Loss Dielectric Substrates Employing Split Post and Single Post Dielectric Resonators

Janina E. Mazierska·Mohan V. Jacob·Dimitri O. Ledenyov·Jerzy Krupka
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Abstract

A split post dielectric resonator in a copper enclosure and a single post dielectric resonator in a cavity with superconducting end-plates have been constructed and used for the complex permittivity measurements of single crystal substrates. (La,Sr)(Al,Ta)O3, LaAlO3, MgO and quartz substrates have been measured at temperatures from 20 K to 300 K in the split post resonator and from 15 K to 80 K in the single post resonator. The TE01delta mode resonant frequencies and unloaded Qo-factors of the empty resonators at temperature of 20 K were: 9.952 GHz and 25,000 for the split post resonator and 10.808 GHz and 240,000 for the single post resonator respectively.

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Janina E. Mazierska, Mohan V. Jacob, Dimitri O. Ledenyov, Jerzy Krupka. 2012-09-01. Complex Permittivity Measurements at Variable Temperatures of Low Loss Dielectric Substrates Employing Split Post and Single Post Dielectric Resonators. https://doi.org/10.1109/mwsym.2004.1338959

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