arXiv · 1112.4948
Identification of high energy ions using backscattered particles in laser-driven ion acceleration with cluster-gas targets
Abstract
A new diagnosis method for high energy ions utilizing a single CR-39 detector mounted on plastic plates is demonstrated to identify the presence of the high energy component beyond the CR-39's detection threshold limit. On irradiation of the CR-39 detector unit with a 25 MeV per nucleon He ion beam from conventional rf-accelerators, a large number of etch pits having elliptical opening shapes are observed on the rear surface of the CR-39. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This ion detection method is applied to laser-driven ion acceleration experiments using cluster-gas targets, and ion signals with energies up to 50 MeV per nucleon are identified.
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Y. Fukuda, H. Sakaki, M. Kanasaki, A. Yogo, S. Jinno, M. Tampo, A. Ya. Faenov, T. A. Pikuz, Y. Hayashi, M. Kando, A. S. Pirozhkov, T. Shimomura, H. Kiriyama, S. Kurashima, T. Kamiya, K. Oda, T. Yamauchi, K. Kondo, S. V. Bulanov. 2011-12-21. Identification of high energy ions using backscattered particles in laser-driven ion acceleration with cluster-gas targets. https://arxiv.org/abs/1112.4948
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