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arXiv · 1112.4823

Generic Microstrip R&D Topics at SCIPP: Longitudinal Charge Division and Length Limitations for Long Strips

Jerome K. Carman·Vitaliy Fadeyev·Khilesh Mistry·Bruce A. Schumm·Edwin Spencer·Aaron Taylor·Max Wilder
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Abstract

We discuss results on the use of charge division to estimate the longitudinal position of charge deposition in silicon microstrip sensors, and on the intrinsic noise limitation of microstrip sensors in the limit of long, narrow strips. We find a resolution of \pm6% of the length of the sensor for a 10cm-long sensor. We also find that network effects significantly reduce sensor readout noise relative to naive expectations that arise from treating the detector resistance and capacitance as single discrete electronic components.

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Jerome K. Carman, Vitaliy Fadeyev, Khilesh Mistry, Bruce A. Schumm, Edwin Spencer, Aaron Taylor, Max Wilder. 2011-12-20. Generic Microstrip R&D Topics at SCIPP: Longitudinal Charge Division and Length Limitations for Long Strips. https://arxiv.org/abs/1112.4823

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