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arXiv · 1109.1046

Xenon purity analysis for EXO-200 via mass spectrometry

A. Dobi·C. Hall·S. Slutsky·Y. -R. Yen·B. Aharmin·M. Auger·P. S. Barbeau·C. Benitez-Medina·M. Breidenbach·B. Cleveland·R. Conley·J. Cook·S. Cook·I. Counts·W. Craddock·T. Daniels·C. G. Davis·J. Davis·R. deVoe·M. Dixit·M. J. Dolinski·K. Donato·W. Fairbank Jr.·J. Farine·P. Fierlinger·D. Franco·G. Giroux·R. Gornea·K. Graham·G. Gratta·C. Green·C. Hagemann·K. Hall·D. Hallman·C. Hargrove·S. Herrin·M. Hughes·J. Hodgson·F. Juget·A. Karelin·L. J. Kaufman·A. Kuchenkov·K. Kumar·D. S. Leonard·G. Lutter·D. Mackay·R. MacLellan·M. Marino·B. Mong·M. Montero Díez·P. Morgan·A. R. Müller·R. Neilson·A. Odian·K. O'Sullivan·A. Piepke·A. Pocar·C. Y. Prescott·K. Pushkin·A. Rivas·E. Rollin·P. C. Rowson·A. Sabourov·D. Sinclair·K. Skarpaas·V. Stekhanov·V. Strickland·M. Swift·K. Twelker·J. -L. Vuilleumier·J. -M. Vuilleumier·M. Weber·U. Wichoski·J. Wodin·J. D. Wright·L. Yang
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Abstract

We describe purity measurements of the natural and enriched xenon stockpiles used by the EXO-200 double beta decay experiment based on a mass spectrometry technique. The sensitivity of the spectrometer is enhanced by several orders of magnitude by the presence of a liquid nitrogen cold trap, and many impurity species of interest can be detected at the level of one part-per-billion or better. We have used the technique to screen the EXO-200 xenon before, during, and after its use in our detector, and these measurements have proven useful. This is the first application of the cold trap mass spectrometry technique to an operating physics experiment.

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A. Dobi, C. Hall, S. Slutsky, Y. -R. Yen, B. Aharmin, M. Auger, P. S. Barbeau, C. Benitez-Medina, M. Breidenbach, B. Cleveland, R. Conley, J. Cook, S. Cook, I. Counts, W. Craddock, T. Daniels, C. G. Davis, J. Davis, R. deVoe, M. Dixit, M. J. Dolinski, K. Donato, W. Fairbank Jr., J. Farine, P. Fierlinger, D. Franco, G. Giroux, R. Gornea, K. Graham, G. Gratta, C. Green, C. Hagemann, K. Hall, D. Hallman, C. Hargrove, S. Herrin, M. Hughes, J. Hodgson, F. Juget, A. Karelin, L. J. Kaufman, A. Kuchenkov, K. Kumar, D. S. Leonard, G. Lutter, D. Mackay, R. MacLellan, M. Marino, B. Mong, M. Montero Díez, P. Morgan, A. R. Müller, R. Neilson, A. Odian, K. O'Sullivan, A. Piepke, A. Pocar, C. Y. Prescott, K. Pushkin, A. Rivas, E. Rollin, P. C. Rowson, A. Sabourov, D. Sinclair, K. Skarpaas, V. Stekhanov, V. Strickland, M. Swift, K. Twelker, J. -L. Vuilleumier, J. -M. Vuilleumier, M. Weber, U. Wichoski, J. Wodin, J. D. Wright, L. Yang. 2011-09-06. Xenon purity analysis for EXO-200 via mass spectrometry. https://doi.org/10.1016/j.nima.2012.01.066

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