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arXiv · 1106.3676

A Simple Model to Measure Linewidth Enhancement Factor (α) for Multi-wavelengths Semiconductor Laser

Samir K Mondal
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Abstract

A novel and simple model is proposed for the measurement of the linewidth enhancement factor (LEF) α of multiwavelengths semiconductor laser. It is based on the suppression characteristics of an arbitrary mode while other modes are optically injection locked individually. The proposed model can be used to measure α value of individual modes of multi-wavelengths laser with large mode spacing. As a proof of the concept, the model is used to experimentally measure α of a mode of a slotted Fabry- Pérot laser source.

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Samir K Mondal. 2011-06-18. A Simple Model to Measure Linewidth Enhancement Factor (α) for Multi-wavelengths Semiconductor Laser. https://arxiv.org/abs/1106.3676

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