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arXiv · 1106.3128

Evidence of defect-induced ferromagnetism in ZnFe$_{2}$O$_{4}$ thin films

C. E. Rodríguez Torres·F. Golmar·M. Ziese·P. Esquinazi·S. P. Heluani
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Abstract

X-ray absorption near-edge and grazing incidence X-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe$_{2}$O$_{4}$ thin films. The spectroscopy techniques are used to determine the non-equilibrium cation site occupancy as a function of depth and oxygen pressure during deposition and its effects on the magnetic properties. It is found that low deposition pressures below 10$^{-3}$ mbar cause iron superoccupation of tetrahedral sites without Zn$^{2+}$ inversion, resulting in an ordered magnetic phase with high room temperature magnetic moment.

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C. E. Rodríguez Torres, F. Golmar, M. Ziese, P. Esquinazi, S. P. Heluani. 2011-06-16. Evidence of defect-induced ferromagnetism in ZnFe$_{2}$O$_{4}$ thin films. https://doi.org/10.1103/physrevb.84.064404

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