arXiv · 1010.5929
Sub-wavelength surface IR imaging of soft-condensed matter
Abstract
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.
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James H. Rice, Graeme A. Hill, Stephen R. Meech, Paulina Kuo, Konstantin Vodopyanov, Michael Reading. 2010-10-28. Sub-wavelength surface IR imaging of soft-condensed matter. https://doi.org/10.1051/epjap%2F2010093
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