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arXiv · 1009.2393

Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms

B. Gamm·R. Popescu·H. Blank·R. Schneider·A. Beyer·A. Gölzhäuser·D. Gerthsen
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Abstract

Single atoms can be considered as basic objects for electron microscopy to test the microscope performance and basic concepts for modeling of image contrast. In this work high-resolution transmission electron microscopy was applied to image single platinum atoms in an aberration-corrected transmission electron microscope. The atoms are deposited on a self-assembled monolayer substrate which induces only negligible contrast. Single-atom contrast simulations were performed on the basis of Weickenmeier-Kohl and Doyle-Turner scattering factors. Experimental and simulated intensities are in full agreement on an absolute scale.

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B. Gamm, R. Popescu, H. Blank, R. Schneider, A. Beyer, A. Gölzhäuser, D. Gerthsen. 2011-09-20. Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms. https://arxiv.org/abs/1009.2393

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