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arXiv · 1008.2445

Trapping-detrapping fluctuations in organic space-charge layers

Anna Carbone·Cecilia Pennetta·Lino Reggiani
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Abstract

A trapping-detrapping model is proposed for explaining the current fluctuation behavior in organic semiconductors (polyacenes) operating under current-injection conditions. The fraction of ionized traps obtained from the current-voltage characteristics, is related to the relative current noise spectral density at the trap-filling transition. The agreement between theory and experiments validates the model and provides an estimate of the concentration and energy level of deep traps.

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Anna Carbone, Cecilia Pennetta, Lino Reggiani. 2010-08-14. Trapping-detrapping fluctuations in organic space-charge layers. https://doi.org/10.1063/1.3271769

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