arXiv · 1006.1167
Weak antilocalization effect in LPE-grown p-Hg0.8Cd0.2Te thin film and the evidence of Te-precipitation
Abstract
The weak antilocalization effect is observed in a p-type Hg0.8Cd0.2Te thin film with thickness ~10 micrometers. Based on the analysis of composition, carrier species and excellent fitting of data with a model concerning weak antilocalization effect in Te crystal, the most plausible explanation is that the observed weak antilocalization effect is caused by Te-precipitation.
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R. Yang, L. M. Wei, G. L. Yu. 2010-06-07. Weak antilocalization effect in LPE-grown p-Hg0.8Cd0.2Te thin film and the evidence of Te-precipitation. https://arxiv.org/abs/1006.1167
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