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arXiv · 1003.2360

Phase Coexistence Near a Morphotropic Phase Boundary in Sm-doped BiFeO3 Films

S. B. Emery·C. -J. Cheng·D. Kan·F. J. Rueckert·S. P. Alpay·V. Nagarajan·I. Takeuchi·B. O. Wells
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Abstract

We have investigated heteroepitaxial films of Sm-doped BiFeO3 with a Sm-concentration near a morphotropic phase boundary. Our high-resolution synchrotron X-ray diffraction, carried out in a temperature range of 25C to 700C, reveals substantial phase coexistence as one changes temperature to crossover from a low-temperature PbZrO3-like phase to a high-temperature orthorhombic phase. We also examine changes due to strain for films greater or less than the critical thickness for misfit dislocation formation. Particularly, we note that thicker films exhibit a substantial volume collapse associated with the structural transition that is suppressed in strained thin films.

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S. B. Emery, C. -J. Cheng, D. Kan, F. J. Rueckert, S. P. Alpay, V. Nagarajan, I. Takeuchi, B. O. Wells. 2010-03-11. Phase Coexistence Near a Morphotropic Phase Boundary in Sm-doped BiFeO3 Films. https://doi.org/10.1063/1.3481065

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