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arXiv · 1002.4069

Pulsed ESR Measurement of Coherence Times in Si:P at Very Low Temperatures

W. D. Hutchison·L. K. Alexander·N. Suwuntanasarn·G. N. Milford
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Abstract

A purpose built millikelvin pulsed x-band ESR system is used to measure spin decoherence times of phosphorus donor spins in 99.92% isotopically pure 28 silicon. The isolated P spin T2 is estimated at 260 (50) ms at 4.2 K and 330 (100) ms at 0.9 K.

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W. D. Hutchison, L. K. Alexander, N. Suwuntanasarn, G. N. Milford. 2010-02-22. Pulsed ESR Measurement of Coherence Times in Si:P at Very Low Temperatures. https://arxiv.org/abs/1002.4069

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