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arXiv · 1002.3812

Highly sensitive frequency metrology for optical anisotropy measurements

Gilles Bailly·Raphaël Thon·Cécile Robilliard
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Abstract

In this paper we present a novel apparatus aimed at measuring very small birefringences and anisotropies, based on frequency metrology and not on polarimetry as usual. In our experiment, a very high finesse resonant cavity is used to convert the phase difference into a resonance frequency difference, which can then be measured with very high accuracy. We describe the set-up and present the results of experimental tests which exhibited a sensitivity dn ~ 2 x 10?18, allowing for the measurement of long-predicted magneto-electro-optical effects in gases. Since the shotnoise limited sensitivity of our apparatus lies well below the state-of-the-art sensitivity, frequency metrology appears as a promising technique for small birefringence measurements.

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Gilles Bailly, Raphaël Thon, Cécile Robilliard. 2010-02-19. Highly sensitive frequency metrology for optical anisotropy measurements. https://doi.org/10.1063/1.3356731

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