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arXiv · 0912.2218

Electrical transport and low-temperature scanning tunneling microscopy of microsoldered graphene

V. Geringer·D. Subramaniam·A. K. Michel·B. Szafranek·D. Schall·A. Georgi·T. Mashoff·D. Neumaier·M. Liebmann·M. Morgenstern
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Abstract

Using the recently developed technique of microsoldering, we perform a systematic transport study of the influence of PMMA on graphene flakes revealing a doping effect of up to 3.8x10^12 1/cm^2, but a negligible influence on mobility and gate voltage induced hysteresis. Moreover, we show that the microsoldered graphene is free of contamination and exhibits a very similar intrinsic rippling as has been found for lithographically contacted flakes. Finally, we demonstrate a current induced closing of the previously found phonon gap appearing in scanning tunneling spectroscopy experiments, strongly non-linear features at higher bias probably caused by vibrations of the flake and a B-field induced double peak attributed to the 0.Landau level of graphene.

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V. Geringer, D. Subramaniam, A. K. Michel, B. Szafranek, D. Schall, A. Georgi, T. Mashoff, D. Neumaier, M. Liebmann, M. Morgenstern. 2009-12-11. Electrical transport and low-temperature scanning tunneling microscopy of microsoldered graphene. https://doi.org/10.1063/1.3334730

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