arXiv · 0911.5469
Single-Electron Tunneling and the Fluctuation Theorem
Abstract
Experiments on the direction-resolved full-counting statistics of single-electron tunneling allow testing the fundamentally important Fluctuation Theorem (FT). At the same time, the FT provides a frame for analyzing such data. Here we consider tunneling through a double quantum dot system which is coupled capacitively to a quantum point contact (QPC) detector. Fluctuations of the environment, including the shot noise of the QPC, lead to an enhancement of the effective temperature in the FT. We provide a quantitative explanation of this effect; in addition we discuss the influence of the finite detector bandwidth on the measurements.
Explore related subjects
Keep this discovery
Y. Utsumi, D. S. Golubev, M. Marthaler, T. Fujisawa, Gerd Schön. 2009-11-29. Single-Electron Tunneling and the Fluctuation Theorem. https://arxiv.org/abs/0911.5469
Cite the original work for its findings. Save a collection to share your selection of sources.