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arXiv · 0910.5209

Anisotropic In-Plane Strain and Transport in Epitaxial Nd(0.2)Sr(0.8)MnO(3) Thin Films

K. P. Neupane·J. J. Neumeier·J. L. Cohn
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Abstract

The structure, morphology, and electrical properties of epitaxial a-axis oriented thin films of Nd(0.2)Sr(0.8)MnO(3) are reported for thicknesses 10 nm <= t <= 150 nm. Films were grown with both tensile and compressive strain on various substrates. It is found that the elongated crystallographic c-axes of the films remain fully strained to the substrates for all thicknesses in both strain states. Relaxation of the a and b axes is observed for t>= 65 nm with films grown under tensile strain developing uniaxial crack arrays (running along the c axis) due to a highly anisotropic thermal expansion. For the latter films, the room-temperature in-plane electrical resistivity anisotropy, rho_b/rho_c, increases approximately exponentially with increasing film thickness to values of ~1000 in the thickest films studied. Films under tension have their Neel temperatures enhanced by ~25 K independent of thickness, consistent with an enhancement of ferromagnetic exchange along their expanded c axes.

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K. P. Neupane, J. J. Neumeier, J. L. Cohn. 2009-10-27. Anisotropic In-Plane Strain and Transport in Epitaxial Nd(0.2)Sr(0.8)MnO(3) Thin Films. https://doi.org/10.1063/1.3269698

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