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arXiv · 0902.2414

Depth-dependent critical behavior in V2H

Charo I. Del Genio·Johann Trenkler·Kevin E. Bassler·Peter Wochner·Dean R. Haeffner·George F. Reiter·Jianming Bai·Simon C. Moss
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Abstract

Using X-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective "skin-layer" of V2H. In the skin-layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.

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Charo I. Del Genio, Johann Trenkler, Kevin E. Bassler, Peter Wochner, Dean R. Haeffner, George F. Reiter, Jianming Bai, Simon C. Moss. 2009-05-07. Depth-dependent critical behavior in V2H. https://doi.org/10.1103/physrevb.79.184113

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