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arXiv · 0807.3798

Multiple-Retrapping Process in High-$T_c$ Intrinsic Josephson Junctions

Myung-Ho Bae·M. Sahu·Hu-Jong Lee·A. Bezryadin
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Abstract

We report measurements of switching-current distribution (SWCD) from a phase-diffusion branch to a quasiparticle-tunneling branch as a function of temperature in a cuprate-based intrinsic Josephson junction. Contrary to the thermal-activation model, the width of the SWCD increases with decreasing temperature, down to 1.5 K. Based on the multiple-retrapping model, we quantitatively demonstrate that the quality factor of the junction in the phase-diffusion regime determines the observed temperature dependence of the SWCD.

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Myung-Ho Bae, M. Sahu, Hu-Jong Lee, A. Bezryadin. 2008-07-24. Multiple-Retrapping Process in High-$T_c$ Intrinsic Josephson Junctions. https://arxiv.org/abs/0807.3798

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