Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes

S. H. Tessmer; I. Kuljanishvili

doi:10.1088/0957-4484/19/44/445503

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arXiv · 0806.1899

Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes

S. H. Tessmer·I. Kuljanishvili

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Abstract

We have developed a modeling method suitable to analyze single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well to approximate analytical expressions and experimental data.

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S. H. Tessmer, I. Kuljanishvili. 2008-06-11. Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes. https://doi.org/10.1088/0957-4484/19/44/445503

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