Evaluation of the impact of solder die attach versus epoxy die attach in a state of the art power package

J. Czernohorsky; B. Maj; Matthias Viering; L. Wright; G. Balanon

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arXiv · 0801.1003

Evaluation of the impact of solder die attach versus epoxy die attach in a state of the art power package

J. Czernohorsky·B. Maj·Matthias Viering·L. Wright·G. Balanon

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Abstract

Subject of this paper is the thermal investigation of epoxy (EDA) and solder (SDA) die attaches by a comparison of an ASIC with multiple heat sources in different package assemblies. Static and transient thermal measurements and simulations were performed to investigate the thermal behavior of two samples in a state of the art QFP power package differing only in the die attach material (EDA and SDA).

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J. Czernohorsky, B. Maj, Matthias Viering, L. Wright, G. Balanon. 2008-01-07. Evaluation of the impact of solder die attach versus epoxy die attach in a state of the art power package. https://arxiv.org/abs/0801.1003

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