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arXiv · 0709.1870

The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

Z. Suszynski·R. Duer·M. Kosikowski
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Abstract

This paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors propose a method which will eliminate such an influence.

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Z. Suszynski, R. Duer, M. Kosikowski. 2007-09-12. The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure. https://arxiv.org/abs/0709.1870

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