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Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy

C. Wang·H. J. Zhang·P. M. He·G. H. Cao
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Abstract

Cleaved and polished surfaces of CaCu$_3$Ti$_4$O$_{12}$ ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu$_3$Ti$_4$O$_{12}$ stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2$p$ unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.

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C. Wang, H. J. Zhang, P. M. He, G. H. Cao. 2007-08-17. Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy. https://doi.org/10.1063/1.2768006

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