Measurements of Luminescence from Cleaved Silicon

Dongguang Li

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arXiv · 0708.1847

Measurements of Luminescence from Cleaved Silicon

Dongguang Li

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Abstract

This paper outlines the results from experiments performed to gain further information about the structure and properties of cleaved silicon surfaces, using vacuum cleavage luminescence detection methods. The experiments involved detecting the luminescence produced by cleaving thin silicon plates within a high vacuum, by a process of converting the luminescence to an amplified electrical signal.

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Dongguang Li. 2007-08-14. Measurements of Luminescence from Cleaved Silicon. https://arxiv.org/abs/0708.1847

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