Observation of a uniform temperature dependence in the electrical resistance across the structural phase transition in thin film vanadium oxide ($VO_{2}$)

R. G. Mani; S. Ramanathan

doi:10.1063/1.2767189

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arXiv · 0707.0885

Observation of a uniform temperature dependence in the electrical resistance across the structural phase transition in thin film vanadium oxide ($VO_{2}$)

R. G. Mani·S. Ramanathan

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Abstract

An electrical study of thin $VO_{2}$ films in the vicinity of the structural phase transition at $68^{0}C$ shows (a) that the electrical resistance $R$ follows $log (R)$ $\propto$ $-T$ over the $T$-range, $20 < T < 80 ^{0}C$ covering both sides of the structural transition, and (b) a history dependent hysteresis loop in $R$ upon thermal cycling. These features are attributed here to transport through a granular network.

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R. G. Mani, S. Ramanathan. 2007-07-05. Observation of a uniform temperature dependence in the electrical resistance across the structural phase transition in thin film vanadium oxide ($VO_{2}$). https://doi.org/10.1063/1.2767189

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