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arXiv · 0705.3675

Phase Change Observed in Ultrathin Ba0.5Sr0.5TiO3 Films by in-situ Resonant Photoemission Spectroscopy

Y. -H. Lin·K. Terai·H. Wadati·M. Kobayashi·M. Takizawa·J. I. Hwang·A. Fujimori·C. -W. Nan·J. -F. Li·S. -I. Fujimori·T. Okane·Y. Saitoh·K. Kobayashi
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Abstract

Epitaxial Ba0.5Sr0.5TiO3 thin films were prepared on Nb-doped SrTiO3 (100)substrates by the pulsed laser deposition technique, and were studied by measuring the Ti 2p - 3d resonant photoemission spectra in the valence-band region as a function of film thickness, both at room temperature and low temperature. Our results demonstrated an abrupt variation in the spectral structures between 2.8 nm (~7 monolayers) and 2.0 nm (~5 monolayers) Ba0.5Sr0.5TiO3 films, suggesting that there exists a critical thickness for phase change in the range of 2.0 nm to 2.8 nm. This may be ascribed mainly to the intrinsic size effects.

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Y. -H. Lin, K. Terai, H. Wadati, M. Kobayashi, M. Takizawa, J. I. Hwang, A. Fujimori, C. -W. Nan, J. -F. Li, S. -I. Fujimori, T. Okane, Y. Saitoh, K. Kobayashi. 2007-05-24. Phase Change Observed in Ultrathin Ba0.5Sr0.5TiO3 Films by in-situ Resonant Photoemission Spectroscopy. https://doi.org/10.1063/1.2745249

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